The Cornell NanoScale Facility (CNF) at Cornell University has partnered with Xallent LLC to develop a next generation diagnostic tool to more rapidly and economically test and characterize semiconductor devices and thin film materials during manufacturing. This tool is built on Xallent’s innovative nanoscale imaging and probing technology. The ability to rapidly probe and measure electrical components at the nanoscale for diagnostics and failure analysis non-destructively is expected to tap a broad range of industry applications. The Manufacturing Innovation Grant will be used to adapt Xallent’s nanomachine platforms to analytical instruments at the Cornell NanoScale Facility for validation, user interface focus, and reliability studies to ready the company for product launch and scale up. Additionally, this project will help Xallent add 8 new jobs by the end of 2019.